New Method for SMT First Article Inspection

Today's SMT electronic factories have multiple models, small batches, and frequent line changes, making the first article inspection task increasingly heavy. The traditional SMT testing method not only wastes manpower and has low efficiency, but also lacks control over the entire testing process, making it difficult to ensure quality. In response to this challenge, Shenzhen Blue Eye Technology Co., Ltd. has pioneered the SMT intelligent first piece inspection instrument. Through continuous upgrading and optimization, a fully automatic first piece inspection instrument has been developed, which has the following advantages:
Save manpower, increase detection efficiency by five times, avoid quality accidents, easy to track test data, simple operation, stable and durable.

Feature Introduction

Automatic recognition and judgment of silk screen characters

For devices such as chips, diodes, and screen printed resistors, optical systems can automatically determine defects such as screen printing, wrong materials, reverse direction, and missing patches.

Device query and retrieval
Support multiple search methods, such as displaying or searching for undetected NG components, angles, specifications, and models.

Report function
After the test is completed, a test report can be automatically generated, accompanied by device images and relevant information of PCBA. Reports can be archived, printed, and sent via email.

Equipment is stable and durable
The overall architecture adopts a marble platform, fully ensuring the stability and long-term durability of equipment operation.